Munich, May 10, 2011 – Berner & Mattner presents the new product releases of MESSINA 3.1 and CTE XL Professional 2.1 at the Automotive Testing Expo Europe in hall 1, stand 1537, at Messe Stuttgart. From May 17 to 19, 2011, test engineers can assure themselves of the coherent overall concept - from specification to HiL-testing. The key changes are: CTE XL Professional now offers the unique possibility of requirement tracing besides the systematic specification and generation of test cases. MESSINA, the platform for SiL and HiL tests, can now be run on Windows as well. In addition, MESSINA offers a unique AUTOSAR test RTE for virtual integration based on ARTOP.

Information on event
Press release (pdf, 48 KB)
Press release with images (rar, 133 KB)