Berner & Mattner with new releases at Automotive Testing Expo Europe 2011:

AUTOSAR software testing during the development process with Windows

Munich, May 10, 2011 – Berner & Mattner presents the new product releases of MESSINA 3.1 and CTE XL Professional 2.1 at the Automotive Testing Expo Europe in hall 1, stand 1537, at Messe Stuttgart. From May 17 to 19, 2011, test engineers can assure themselves of the coherent overall concept - from specification to HiL-testing. The key changes are: CTE XL Professional now offers the unique possibility of requirement tracing besides the systematic specification and generation of test cases. MESSINA, the platform for SiL and HiL tests, can now be run on Windows as well. In addition, MESSINA offers a unique AUTOSAR test RTE for virtual integration based on ARTOP.

Foto MESSINA CTE Konzept

Virtual integration with MESSINA and CTE

Event

Automotive Testing Expo Europe 2011

Date:
May 17 - 19, 2011

Venue:
Messe Stuttgart

Information on event
Bild Pfeil Press release (pdf, 48 KB)
Bild Pfeil Press release with images (rar, 133 KB)
 
Berner & Mattner